Dynamic Light Scattering and Zeta Potential
Dynamic light scattering measures particle size and distribution in solution through Brownian motion analysis, while zeta potential quantifies surface charge and colloidal stability.
Atomic Force Microscopy (AFM)
Atomic force microscopy uses a sharp tip scanned across a surface to measure topographic and mechanical properties with nanometer resolution, operating in air, liquid, or vacuum environments.
Transmission Electron Microscopy (TEM)
Transmission electron microscopy uses a beam of electrons transmitted through an ultra-thin specimen to form images with atomic resolution, revealing internal structure, crystallography, and composition.
Scanning Electron Microscopy (SEM)
Scanning electron microscopy uses a focused electron beam to generate high-resolution images of sample surfaces, revealing topography, morphology, and composition at the micro- and nanoscale.
Showing 13 to 13 of 13 results